Radio Absorber with High Angular Stability of Resonance Frequency Based on Artificial Magnetic Conductor and Resistive Film

Yu. N. Kazantsev; Казанцев Ю. Н.; G. A. Kraftmakher; Крафтмахер Г. А.; V. P. Maltsev; Мальцев В. П.; V. S. Solosin; Солосин В. С.

doi:10.31857/S0033849423070045

Radio Absorber with High Angular Stability of Resonance Frequency Based on Artificial Magnetic Conductor and Resistive Film

Авторлар: Kazantsev Y.N.¹, Kraftmakher G.A.¹, Maltsev V.P.¹, Solosin V.S.¹^,2
Мекемелер:
1. Kotelnikov Institute of Radioengineering and Electronics (Fryazino Branch), Russian Academy of Sciences
2. Institute of Theoretical and Applied Electrodynamics, Russian Academy of Sciences
Шығарылым: Том 68, № 8 (2023)
Беттер: 811-816
Бөлім: ЭЛЕКТРОДИНАМИКА И РАСПРОСТРАНЕНИЕ РАДИОВОЛН
URL: https://modernonco.orscience.ru/0033-8494/article/view/650490
DOI: https://doi.org/10.31857/S0033849423070045
EDN: https://elibrary.ru/WOQNAQ
ID: 650490

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Аннотация
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Әдебиет тізімі
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Статистика

Аннотация

A structure of a radio absorber (RA) with a high stability of resonance frequency based on a resistive film with a sheet resistance of 120 Ω/sq and an artificial magnetic conductor in a pair of capacitive gratings on a dielectric layer with a high permittivity (epsilon_1 >>1) metallized on the opposite side is proposed. The results of numerical calculations of the frequency–angular dependences of the RA reflection coefficient confirm preliminary estimates obtained from analytical expressions. For example, at epsilon_1 = 20 , the shift of the resonance frequency is no greater than 2% at angles of incidence of phi=0^o...60^o , and the bandwidth-to-thickness ratio is 4.29 at phi=0.

Негізгі сөздер

radio absorber, high stability of resonance frequency, frequency–angular dependences, reflection coefficient

Әдебиет тізімі

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