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Journal of Surface Investigation. X-Ray, Synchrotron and Neutron Techniques
ISSN 1028-0960 (Print) ISSN 3034-5731 (Online)
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Keywords X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy channeling electron microscopy ion implantation irradiation magnetron sputtering microstructure nanoparticles neutron reflectometry optical properties phase composition scanning electron microscopy silicon structure surface surface morphology synchrotron radiation thin films zinc oxide
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Keywords X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy channeling electron microscopy ion implantation irradiation magnetron sputtering microstructure nanoparticles neutron reflectometry optical properties phase composition scanning electron microscopy silicon structure surface surface morphology synchrotron radiation thin films zinc oxide
Home > Search > Author Details

Author Details

Andreev, V. V.

Issue Section Title File
No 1 (2023) Articles Change in the Charge State of MOS Structures with a Radiation-Induced Charge under High-Field Injection of Electrons
No 3 (2025) Articles Change in the charge state of MOS structures under radiation and high-field injection at constant voltage
 

 

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