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Journal of Surface Investigation. X-Ray, Synchrotron and Neutron Techniques
ISSN 1028-0960 (Print) ISSN 3034-5731 (Online)
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Keywords X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy channeling electron microscopy ion implantation irradiation magnetron sputtering microstructure nanoparticles neutron reflectometry optical properties phase composition scanning electron microscopy silicon structure surface surface morphology synchrotron radiation thin films zinc oxide
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Keywords X-ray diffraction X-ray photoelectron spectroscopy atomic force microscopy channeling electron microscopy ion implantation irradiation magnetron sputtering microstructure nanoparticles neutron reflectometry optical properties phase composition scanning electron microscopy silicon structure surface surface morphology synchrotron radiation thin films zinc oxide
Home > Search > Author Details

Author Details

Глушкова, Т. И.

Issue Section Title File
No 4 (2023) Articles Simulation of Optical Parameters of Scintillation Position-Sensitive Detectors with Organic Light Guide
No 8 (2024) Articles Development of a Linear Position-Sensitive Scintillation Neutron Detector Based on ZnS(AG):6Li and Silicon Photomultipliers
 

 

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